The RESIST project targets reliability aware design methods and run-time adaptive approaches for next-generation resilient integrated electronic systems in Automotive and Avionics. The focus is on reliability, cost-effectiveness and quality of semiconductor devices. The consortium consists of semiconductor companies, SME's, academia, institutes, and end users. Expected benefits are >2x more cost-effective resilience solutions, >25years lifetime of embedded devices, >20% higher component/integration density at the same level of reliability, and up to 30% reduced reliability testing costs. An early-warning system by health monitoring of system components will be developed.