dr. Yu Bi

PhD student
Circuits and Systems (CAS), Department of Microelectronics

PhD thesis (Jul 2012): Sensitivity Modeling of On-chip Capacitances: Parasitics Extraction for Manufacturing Variability
Promotor: Patrick Dewilde, Nick van der Meijs

Expertise: VLSI design verification

Themes: VLSI design verification

Biography

Yu Bi was a PhD student of prof. Patrick Dewilde and dr. Nick van der Meijs, working on VLSI design verification, in particular parasitic capacitance extraction.

Last updated: 8 Nov 2014

Yu Bi

Alumnus