dr.ir. E. Schrik

PhD student
Circuits and Systems (CAS), Department of Microelectronics

PhD thesis (Sep 2006): A combined BEM/FEM method for IC substrate modeling
Promotor: Patrick Dewilde, Nick van der Meijs

Expertise: IC substrate modeling

Themes: VLSI design verification

Biography

Eelco Schrik was a PhD student with prof. Patrick Dewilde and dr. Nick van der Meijs. He graduated in 2006.

Publications

  1. A combined BEM/FEM method for IC substrate modeling
    E. Schrik;
    PhD thesis, TU Delft, Dept. EEMCS, September 2006.
    document

  2. Substrate resistance modeling by combination of BEM and FEM methodologies
    E. Schrik; N.P. van der Meijs;
    In Scientific computing in electrical engineering,
    Heidelberg, Springer, 2004.

  3. Combined BEM/FEM vs. 3D FEM substrate resistance modeling
    E. Schrik; N.P. van der Meijs;
    In Prorisc'04,
    Veldhoven, November 2004.

  4. Comparing Two Y$\Delta$ Based Methodologies for Realizable Model Reduction
    E. Schrik; N. P. van der Meijs;
    In ProRISC IEEE 14th Annual Workshop on Circuits, Systems and Signal Processing,
    November 2003.
    document

  5. Coherent Interconnect/Substrate Modeling Using SPACE - An Experimental Study
    E. Schrik; A.J. van Genderen; N.P. van der Meijs;
    In Proc. of the 33rd European Solid-State Device Research Conf.,
    Estoril, Portugal, pp. 585 -- 588, September 2003.
    document

  6. Combined BEM/FEM Substrate Resistance Modeling
    E. Schrik; N.P. van der Meijs;
    In Proc. 39th Design Automation Conference,
    New Orleans, LA, pp. 771-776, June 2002.
    document

  7. Substrate Resistance Modeling by Combination of BEM and FEM Methodologies
    E. Schrik; N.P. van der Meijs;
    In W.H.A. Schilders; S.H.M.J. Houben; E.J.W. ter Maten (Ed.), Scientific Computation in Electrical Engineering 2002,
    Eindhoven, NL, pp. 171-172, June 2002. ISBN 90-9015894-4.
    document
    poster http://cas.et.tudelft.nl/space/publications/2002/sceeposter_final.pdf

  8. Theoretical and Practical Validation of Combined BEM/FEM Substrate Resistance Modeling
    E. Schrik; P.M. Dewilde; N.P. van der Meijs;
    In Proc. Int. Conf. on Computer-Aided Design,
    San Jose, CA, pp. 10--15, November 2002.
    document

  9. Modeling Capactive Effects via the Substrate
    A. J. van Genderen; N. P. van der Meijs; E. Schrik;
    In ProRISC IEEE 12th Annual Workshop on Circuits, Systems and Signal Processing,
    pp. 366--370, November 2001.
    document

  10. Combined BEM/FEM Resistance Modeling of Stratified Substrates with Layout-Dependent Doping Patterns in the Top Layer
    E. Schrik; A. J. van Genderen; N. P. van der Meijs;
    In ProRISC IEEE 12th Annual Workshop on Circuits, Systems and Signal Processing,
    pp. 598--604, November 2001.
    document

BibTeX support

Last updated: 13 Jul 2016

Eelco Schrik

Alumnus